Faulty wafers also usually have subtle defects randomly scattered on the surface, and this prevents AOI systems from setting rules for efficient inspections.
Excessive adhesive may remain on the chip or overflow on the circuit board and cause the chip to tilt, affecting stability of the whole semiconductor package.
SolVision’s AI technology optimizes yarn inspection by accurately detecting various yarn defects quickly and efficiently, ensuring enhanced quality control.
Powered by AI, Solomon SolVision can automate welding inspection processes by learning the different shapes and features of weld beads from sample images.