Defect Detection

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    AI Inspection Solution for Semiconductor Wafers

    Using SolVision’s AI Inspection Solution, minute defects such as fine scratches can be located and marked on sample images to train the AI model.

  • Inspecting Safety Certification Marks

    Inspecting Safety Certification Marks. Solomon SolVision’s AI automated detection of defective certification marks .

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    Inspecting Semiconductor Packaging Processes

    SolVision enables visual inspection through AI image analysis, strengthening the reliability of displacement and angle information to recognize defective products and errors in the die bonding process.

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    Visual Inspection of Automotive Weld Beads

    Powered by AI, SolVision deep learning software trains an AI model by simulating potential weld bead defects in random brightness conditions.

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    HDD Mounting Bracket Defect Detection Using AI

    SolVision enhances HDD mounting bracket defect detection through advanced AI, ensuring higher standards in electronics manufacturing.

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    Automating Semiconductor Wafer Inspections

    Faulty wafers also usually have subtle defects randomly scattered on the surface, and this prevents AOI systems from setting rules for efficient inspections.

  • Detecting Adhesion Defects in Semiconductors

    Excessive adhesive may remain on the chip or overflow on the circuit board and cause the chip to tilt, affecting stability of the whole semiconductor package.

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    Automating Quality Inspection of Lead Frames

    As semiconductor manufacturing becomes more sophisticated, the process of creating lead frames needs to improve in accuracy and yield.

  • PCB Assembly Inspection Using AI

    SolVision optimizes PCB assembly inspection with AI, enhancing accuracy, reducing errors, and boosting efficiency with our rapid learning AI vision system.